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JEOL : Lancement commercial de HAXIS : le nouveau microscope électronique à balayage avec fraisage ionique à faible angle

Published by AFP · France 14 h ago

JEOL Ltd. (Président-directeur général : Izumi Oi) annonce le développement de son nouveau microscope électronique à balayage avec fraisage ionique à faible angle, HAXIS, dont les…

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